FIB Preparation of Bone–Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography
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چکیده
Osseointegration refers to the direct bonding between titanium implants and bone, making it one of the key factors for the success of reconstructive and regenerative orthopaedic and dental surgeries [1]. Resolving the implantbone interface with high chemical or spatial resolution enables a clearer determination of bone growth mechanisms at the implant interface and optimal modification of implant surfaces. Due to the inhomogeneity of bone tissue, projection-based imaging such as HAADF-STEM imaging often leads to misinformation at the region of highest interest, the interface.
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تاریخ انتشار 2014